Search results for "mounting loss"

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Achieving high effectiveQ-factors in ultra-high vacuum dynamic force microscopy

2010

The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the forc…

Materials scienceCantileverMicroscopebusiness.industryApplied MathematicsUltra-high vacuumQ-factorNanotechnology530NC-AFMlaw.inventionforce microscopyFixation (surgical)lawQ factormounting lossMicroscopyForce dynamicsOptoelectronicscantileverbusinessInstrumentationEngineering (miscellaneous)Non-contact atomic force microscopyMeasurement Science and Technology
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